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Single wafer inspection equipment Product List

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Flat Sheet Inspection Device "PIE-650M"

Achieving high-precision defect detection in a compact space. Contributes to improving product quality, enhancing work efficiency, and reducing labor.

The "PIE-650M" is a flat sheet inspection device capable of detecting defects ranging from fine imperfections to subtle variations in density with high speed and precision. The transport section features a transport robot driven by a linear motor, allowing for stable conveyance. It enables inspections with different optical systems using a single unit. It can be used for inspecting films, glass, metal foils, laminated boards, resins, copper plates, steel plates, non-woven fabrics, rubber, food, and more. 【Features】 ■ Capable of detecting a variety of defects with a single unit ■ Achieves handling without being constrained by the size and weight of the objects ■ Detects fine defects and subtle variations in density with high speed and precision ■ Inspects multiple defects in a compact space ■ Excellent operability *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Single wafer inspection equipment

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High-speed automatic feeding sheet inspection machine 'S-Con III'

A conveyor inspection device that continuously inspects each piece while automatically supplying them with a feeder!

The "S-Con III" is an image inspection machine for sheet labels, cards, and sheets. The supply section can be equipped with a standard bottom feeder or a multi-feeder capable of bulk supply, with a maximum transport speed three times faster than conventional products, at 60m/min. Using a high-resolution line camera, it automatically detects fine defects such as pinholes, chips, overflows, smudges, foreign objects, and scratches. 【Features】 ■ Transport speed of 60m/min, high-speed inspection machine for sheet labels, cards, and sheets ■ The supply section can be selected between a standard bottom feeder or a multi-feeder for bulk supply ■ The suction conveyor method corrects warped workpieces for stable inspection ■ Achieves high-definition color processing with a three-plate color line camera (2K, 4K) ■ High-precision inspection with a resolution of 46μm (field of view 190mm, using a 4K line sensor) *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Single wafer inspection equipment

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